4.3.14 · D4Semiconductor Fabrication

Exercises — Atomic layer deposition (ALD)

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The two facts that unlock almost everything below:

Reminders of what each symbol means in a picture:

  • (theta) — read it as "what fraction of the parking spots on the surface are already taken." empty, full. See the saturation figure.
  • — how much thicker the film gets in one full A→purge→B→purge cycle, measured in ångström (1 Å nm m).
  • Aspect ratio (AR) — for a hole, depth ÷ width. A 40:1 hole is 40× deeper than it is wide.
Figure — Atomic layer deposition (ALD)

Level 1 — Recognition

L1.1

Three processes are described. Which one is ALD, and give the single deciding feature.

  • (a) Both precursor gases flow into the chamber at the same time; film grows continuously.
  • (b) A metal target is bombarded with argon ions; atoms fly in straight lines onto the wafer.
  • (c) Precursor A is pulsed, then inert gas purges, then precursor B is pulsed, then purge — repeated.
Recall Solution

(c) is ALD. The deciding feature is that the precursors are pulsed sequentially and never together, with a purge between them.

L1.2

In one ALD cycle the sequence is written P–P–P–P. Fill in what each P stands for, in order.

Recall Solution

Pulse A → Purge → Pulse B → Purge. (Mnemonic from the parent: "Please Purge, Please Purge.")

L1.3

True or false: "Running each precursor pulse twice as long doubles the film thickness."

Recall Solution

False. Each half-reaction is self-limiting — once the surface sites are used up, and the reaction stops. Longer pulses beyond saturation add nothing. Thickness is set by cycle count, per .


Level 2 — Application

L2.1

You need a 6 nm Al₂O₃ film. The GPC is . How many cycles?

Recall Solution

Convert first so units match: (since ). Answer: 50 cycles.

L2.2

A recipe runs 120 cycles and ellipsometry (see Thin-Film Thickness Metrology (Ellipsometry)) measures the film at 10.8 nm. What is the measured GPC in Å/cycle?

Recall Solution

Rearrange the thickness law for GPC: Answer: 0.90 Å/cycle — right in the typical Al₂O₃ band of 0.9–1.2 Å/cycle.

L2.3

For one half-reaction, . What surface coverage is reached after a 2 s pulse?

Recall Solution

Plug into the saturation law: Answer: (about 63 % of sites reacted). Look at the saturation figure: at the curve has always climbed to exactly , regardless of the number's size.


Level 3 — Analysis

L3.1

A pulse gives after 2 s (from L2.3). How long must the pulse be to reach ? What does this tell you about "over-dosing"?

Recall Solution

Solve the saturation law for . Start from , so , and taking the natural log (the operation that undoes the exponential): With and : Meaning: going from 63 % to 95 % coverage took the pulse from 2 s to 6 s — triple the time for the last third of the sites. The exponential approach means the final empty sites are the rarest for an incoming molecule to hit. That's why real recipes over-dose: to guarantee the stubborn last sites saturate.

L3.2

A DRAM trench (see DRAM Capacitor Fabrication) has aspect ratio 40:1. Explain, using the self-limiting idea, why ALD coats the trench bottom to the same thickness as the top — while sputtering cannot.

Recall Solution

Sputtering is line-of-sight: atoms travel in straight lines, so the trench opening shadows the bottom — the top gets thick, the bottom gets starved. Look at the trench figure, left panel. ALD is chemically self-limiting. Even though precursor reaches the deep bottom slowly (diffusion down a narrow 40:1 hole), every surface still reacts only until its sites are consumed, then stops at the same everywhere. The top cannot "over-grow" because it, too, saturated and stopped. Give the molecules enough dose/purge time to diffuse to the bottom and you get ~100 % conformal step coverage. Right panel of the figure.

L3.3

Two labs both target a 5.0 nm film with GPC Å/cycle, so both run 50 cycles. Lab X purges properly; Lab Y skips the purges to "save time." Predict the film quality difference and name the mechanism.

Recall Solution

Both count 50 cycles, but Lab Y is no longer doing ALD. Without purges, leftover precursor A is still in the chamber when B is pulsed, so A and B react in the gas phase — this is Chemical Vapor Deposition (CVD)-like growth: rough surface, particle contamination, and loss of conformality in the trench. Mechanism: the purge is what enforces "surface-only" reaction. Remove it and you lose the self-limiting referee. Lab X gets a smooth, conformal 5 nm film; Lab Y gets an uneven, possibly thicker, defect-ridden layer.


Level 4 — Synthesis

L4.1

Design a full recipe. Requirement: 8 nm HfO₂ for a high-k gate dielectric. Measured GPC Å/cycle. Each cycle costs (pulse+purge+pulse+purge). Give (a) cycle count and (b) total process time in minutes.

Recall Solution

(a) , so (b) Total time Answer: 80 cycles, ≈ 5.3 minutes.

L4.2

Your saturation study shows the film needs at the trench bottom for a good device. Diffusion makes the effective at the bottom only (four times slower than the at the top). What pulse length guarantees the bottom hits 0.99, and what coverage does the top then have?

Recall Solution

Design for the worst case (the bottom). Using with , : Top coverage at that same 23 s but with its faster : Answer: a ≈ 23 s pulse. The top is at essentially 100 % (over-dosed, which is harmless — it simply stopped at ), while the bottom just reaches the required 0.99. This is exactly why deep-trench ALD uses long doses.


Level 5 — Mastery

L5.1

An engineer measures GPC vs. temperature and finds it flat from 150 °C to 250 °C, then rising above 250 °C and rising below 150 °C. Identify each region, name the underlying failure, and state which region you'd run the process in — and why the flat region is the signature of true ALD.

Recall Solution
  • 150–250 °C (flat): the ALD window. Growth is purely surface-controlled and self-limiting, so GPC is independent of temperature. Run here — it's the reproducible regime.
  • Above 250 °C (rising): thermal decomposition. The precursor breaks down on its own like CVD, adding uncontrolled extra growth — GPC climbs, self-limiting is lost. (Ligand desorption can also spoil coverage here.)
  • Below 150 °C (rising): precursor condensation / incomplete reaction. Precursor physically condenses (multilayers) or reacts too sluggishly, so apparent GPC rises and varies. Why flat = true ALD: if growth depended on time, flux, or temperature you would not get a plateau. A flat GPC proves the surface itself is stopping every pulse — the mathematical fingerprint of self-limiting chemistry (rooted in the Langmuir picture from Surface Chemistry & Adsorption).

L5.2

A process claims "one perfect monolayer per cycle." A monolayer of Al₂O₃ corresponds to about , yet the measured GPC is . Compute the fraction of a monolayer deposited per cycle and explain the physical cause.

Recall Solution

Answer: about 0.44 of a monolayer per cycle — sub-monolayer, as expected. Cause: steric hindrance. The bulky ligands (e.g. the three methyl groups on TMA) physically occupy space and block neighbouring surface sites, so not every site can react in one pulse. "Atomic layer" in the name refers to layer-by-layer control, not one complete monolayer per cycle.

L5.3

Prove, from the saturation law, that however small is, coverage always reaches at the specific time . Why is this a useful diagnostic when characterising a new precursor?

Recall Solution

Substitute into : The cancels — the result is a universal constant, independent of pressure or rate constant. Diagnostic use: to find an unknown , find the pulse length at which coverage (or measured film) reaches 63.2 % of its saturated value; that pulse length is . So . It converts a hard curve-fit into reading off a single characteristic time — the same "time constant" trick used for any exponential.


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