Below each formula symbol is plain: b is "how many bits we cram in one cell", L=2b is "how many charge buckets that needs", and δV is "how far apart those buckets sit". Keep the picture of a bar of voltage sliced into L slots in your head — figure s01 draws exactly that.
WHAT: convert levels → bits with b=log2L.
WHY that tool:log2 is the exact question "2 to the what power gives 8?" — it undoes the exponent in L=2b.
b=log28=3(because 23=8)
Three bits per cell is called TLC (Triple-Level Cell).
Recall Solution L1.2
L=24=16,L−1=15WHY L−1: the guard bands are the gaps between the buckets. With 16 fence posts you get 15 gaps (fencepost rule) — the same reason a 4-rung ladder has 3 spaces between rungs.
WHAT: split the window evenly across the gaps.
L=23=8,L−1=7,δV=74.2=0.6 VWHY divide by 7 not 8: the level centres span the window; between 8 centres there are 7 intervals. Look at s01 — count the gaps, not the bars.
Recall Solution L2.2
L=16,L−1=15,δV=154.2=0.28 V
Shrink factor vs TLC:
δVQLCδVTLC=0.280.6=715≈2.14Meaning: the same charge-leakage smear now eats more than double the fraction of each gap. See s02 — the QLC point sits far below the TLC point, showing how fast the spacing collapses.
Recall Solution L2.3
Capacity =N×b.
SLC: 5×1011×1=5×1011 bitsQLC: 5×1011×4=2×1012 bitsWHY linear: each cell independently holds b bits, and there are N of them — multiply. QLC gives 4× the data on the same silicon, the entire commercial reason it exists. (See SLC Cache and SSD Write Amplification.)
WHAT: take the ratio of the two margins.
δVQLCδVSLC=ΔVwindow/(24−1)ΔVwindow/(21−1)=21−124−1=115=15WHY the window cancels: both cells share the same physical window, so ΔVwindow appears in numerator and denominator and drops out. The crowding is purely about how many gaps you carve — a geometric fact, independent of the voltage value. QLC has 15 gaps where SLC has 1, so each gap is 1/15 as wide.
Recall Solution L3.2
Relative margin =δVSLCδVb=2b−121−1=2b−11.
b
L−1=2b−1
relative margin
1
1
1
2
3
1/3≈0.333
3
7
1/7≈0.143
4
15
1/15≈0.067
The claim is false. Halving would give 1,21,41,81. Reality falls faster than that early on (1→31 is worse than halving) because the denominator 2b−1 grows exponentially, not by a fixed factor. The loss is not a subtraction and not a clean halving — it is governed by 2b−11.
Recall Solution L3.3
One-level slip (110 → 010): compare bit by bit — only the leftmost bit changes (1→0). 1 bit flips.WHY that is the whole point of Gray code: adjacent levels are the ones whose voltage smears touch and get confused, so we designed them to differ in exactly one bit — the minimum possible, easiest for ECC to repair. (See Gray Code and Error Correction Codes (LDPC/BCH).)
Two-level jump (110 → 011): compare — bits change at position 1 (1→0) and position 3 (0→1). 2 bits flip. Gray code only guarantees single-bit difference for neighbours; a two-level jump can flip more. That is why keeping the physical smear inside one gap (good margin) matters even with Gray coding.
Lifetime (days) ≈ endurance cycles, so divide by 365 for years.
SLC: 365105≈274 yearsQLC: 365103≈2.74 yearsRatio:105/103=100× longer for SLC.
Physical reason: every erase tunnels electrons through the oxide, slowly damaging it and widening the smear. QLC starts with almost no margin (δV is 1/15 of SLC's), so tiny oxide wear pushes smears into overlap far sooner → far fewer safe cycles. (See Wear Leveling and Flash Endurance.)
Recall Solution L4.2
WHAT: time = data ÷ rate.
tQLC=402000=50 s,tSLC=2502000=8 sSpeedup:50/8=6.25× faster to accept the burst.
WHY this works: SLC mode has only 2 levels, so its target distributions are wide — ISPP needs far fewer verify pulses (see Threshold Voltage and ISPP Programming). The drive absorbs the burst fast, then migrates the data to dense QLC later while idle. The cost is later write-amplification when migrating. (See SLC Cache and SSD Write Amplification.)
WHAT: the margin must satisfy δV≥4σ.
4σ=4×0.05=0.2 V (minimum allowed spacing)Solve for the largest L whose spacing still meets it:δV=L−14.2≥0.2⟹L−1≤0.24.2=21⟹L≤22
Now L must be a power of two, L=2b. The largest power of two ≤22 is 16=24.
bmax=4 (QLC)Check b=5 (PLC):L=32, L−1=31, δV=4.2/31=0.135 V<0.2 V → fails. So this process cannot safely do PLC.
WHY this is the whole game: cell design is a fight between the fixed window, the fixed smear width σ, and how greedily you slice. Every extra bit doubles L, and δV∝1/(2b−1) falls off a cliff — eventually crossing below the smear-driven floor. See s02 for the visual crossover.
Recall Solution L5.2
Usable bits per cell = (raw bits per cell) × (1 − ECC overhead).
TLC: 3×(1−0.10)=3×0.90=2.70 usable bitsQLC: 4×(1−0.25)=4×0.75=3.00 usable bitsQLC still wins with 3.00 vs 2.70 usable bits/cell — but the gap (3.00/2.70≈1.11, only 11%) is far smaller than the raw 4/3≈33% headline. Insight: the reliability tax (bigger ECC, from Error Correction Codes (LDPC/BCH)) quietly erodes much of QLC's density advantage. If QLC's overhead ever exceeded 32.5%, TLC would win — solve 4(1−x)=2.70⇒x=0.325.