Level 5 — MasteryDoping & PN Junctions

Doping & PN Junctions

90 minutes60 marksprintable — key stays hidden on paper

Level 5 — Mastery (cross-domain: physics + mathematics + coding) Time limit: 90 minutes Total marks: 60

Physical constants (use as needed):

  • kB=1.381×1023 J/K=8.617×105 eV/Kk_B = 1.381\times10^{-23}\ \text{J/K} = 8.617\times10^{-5}\ \text{eV/K}
  • q=1.602×1019 Cq = 1.602\times10^{-19}\ \text{C}
  • ε0=8.854×1012 F/m\varepsilon_0 = 8.854\times10^{-12}\ \text{F/m}
  • Silicon: εr=11.7\varepsilon_r = 11.7, ni=1.0×1010 cm3n_i = 1.0\times10^{10}\ \text{cm}^{-3} at T=300 KT=300\ \text{K}

Question 1 — Built-in potential, depletion physics & space charge (22 marks)

A silicon abrupt PN junction at T=300 KT=300\ \text{K} is doped with acceptor concentration NA=1×1017 cm3N_A = 1\times10^{17}\ \text{cm}^{-3} on the p-side and donor concentration ND=1×1016 cm3N_D = 1\times10^{16}\ \text{cm}^{-3} on the n-side. Assume full ionisation.

(a) Starting from mass-action and charge-neutrality arguments, derive the expression Vbi=kBTqln ⁣(NANDni2)V_{bi} = \frac{k_B T}{q}\ln\!\left(\frac{N_A N_D}{n_i^2}\right) and evaluate it numerically. (5)

(b) From Poisson's equation for the abrupt-junction depletion approximation, prove that the total depletion width is W=2εq(1NA+1ND)VbiW = \sqrt{\frac{2\varepsilon}{q}\left(\frac{1}{N_A}+\frac{1}{N_D}\right)V_{bi}} State explicitly the two boundary/continuity conditions you used. (7)

(c) Compute WW numerically (in µm), and the fraction of WW lying in the n-side. Explain physically why the depletion region extends further into the lightly-doped side. (5)

(d) Compute the peak electric field EmaxE_{max} at the metallurgical junction. Sketch (qualitatively) the space-charge density ρ(x)\rho(x), the field E(x)E(x), and the potential V(x)V(x) across the junction, marking their relationships (which is the derivative/integral of which). (5)


Question 2 — Shockley equation, I–V modelling & coding (22 marks)

The ideal diode obeys I=IS ⁣(eqV/(kBT)1)I = I_S\!\left(e^{qV/(k_B T)}-1\right), with IS=1×1014 AI_S = 1\times10^{-14}\ \text{A} at T=300 KT=300\ \text{K}.

(a) Define the thermal voltage VT=kBT/qV_T=k_BT/q and evaluate it at 300 K. Show that for VVTV\gg V_T the forward current increases by roughly a decade for each 60 mV\approx 60\ \text{mV} of applied voltage. Derive the exact voltage step ΔV\Delta V per decade. (5)

(b) For a forward current of I=1 mAI=1\ \text{mA}, compute the required voltage VV. Then compute the small-signal dynamic (diffusion) resistance rd=(dI/dV)1r_d = (dI/dV)^{-1} at that operating point. (5)

(c) Write a Python function (pseudocode acceptable but must be runnable-style) that, given ISI_S, TT and a target current ItargetI_{target}, solves the Shockley equation for VV using Newton–Raphson. Give the iteration formula explicitly, a sensible initial guess, and the stopping criterion. (7)

(d) The reverse saturation current has temperature dependence IST3exp(Eg/(kBT))I_S\propto T^{3}\exp(-E_g/(k_BT)). Explain, with reasoning, why ISI_S roughly doubles every ~10 °C for silicon, and state one consequence for a forward-biased diode driven at fixed voltage. (5)


Question 3 — Junction capacitance & breakdown analysis (16 marks)

(a) For the junction of Question 1, the depletion capacitance per unit area is Cj=ε/WC_j = \varepsilon/W. Derive how CjC_j scales with applied reverse voltage VRV_R (i.e. find the exponent mm in Cj(Vbi+VR)mC_j\propto (V_{bi}+V_R)^{-m} for an abrupt junction) and justify. (5)

(b) Distinguish avalanche and Zener breakdown by mechanism, and explain how each depends on doping concentration and on temperature (sign of the temperature coefficient of breakdown voltage). (6)

(c) A junction shows breakdown at 5.6 V5.6\ \text{V} with a positive temperature coefficient. Classify the mechanism and justify from both the voltage magnitude and the temperature-coefficient sign. (5)

Answer keyMark scheme & solutions

Question 1

(a) (5 marks) In equilibrium the Fermi level is flat. On p-side pNAp\approx N_A; on n-side nNDn\approx N_D. Using np=ni2np=n_i^2:

  • p-side hole density =NA= N_A, n-side hole density =ni2/ND=n_i^2/N_D. (1)
  • Built-in potential balances diffusion; using p(x)=p0eqV/kBTp(x)=p_0 e^{-qV/k_BT} over the junction: pppn=eqVbi/kBT=NAni2/ND=NANDni2\frac{p_p}{p_n}=e^{qV_{bi}/k_BT}=\frac{N_A}{n_i^2/N_D}=\frac{N_A N_D}{n_i^2} (2)
  • Solving: Vbi=kBTqln ⁣NANDni2V_{bi}=\dfrac{k_BT}{q}\ln\!\dfrac{N_AN_D}{n_i^2}. (1)

Numerics: VT=0.02585 VV_T=0.02585\ \text{V}; argument =10171016(1010)2=1013=\frac{10^{17}\cdot10^{16}}{(10^{10})^2}=10^{13}; Vbi=0.02585×ln(1013)=0.02585×29.93=0.774 VV_{bi}=0.02585\times\ln(10^{13})=0.02585\times29.93=0.774\ \text{V}. (1)

(b) (7 marks) Poisson (1-D): dEdx=ρε\dfrac{dE}{dx}=\dfrac{\rho}{\varepsilon}, with ρ=qNA\rho=-qN_A (xp<x<0-x_p<x<0), ρ=+qND\rho=+qN_D (0<x<xn0<x<x_n). (1) Integrate each region; field is triangular, peaking at x=0x=0 and zero at edges:

  • Emax=qNAxp/ε=qNDxn/εE_{max}=qN_A x_p/\varepsilon = qN_D x_n/\varepsiloncharge neutrality NAxp=NDxnN_A x_p=N_D x_n (condition 1). (2)
  • Continuity of EE at x=0x=0 used above; E=0E=0 at depletion edges (condition 2). (1) Potential =Edx=\int E\,dx = area of triangle: Vbi=12Emax(xp+xn)=12EmaxWV_{bi}=\tfrac12 E_{max}(x_p+x_n)=\tfrac12 E_{max}W. (1) With xp=NDNA+NDWx_p=\frac{N_D}{N_A+N_D}W, xn=NANA+NDWx_n=\frac{N_A}{N_A+N_D}W and Emax=qεNANDNA+NDWE_{max}=\frac{q}{\varepsilon}\frac{N_AN_D}{N_A+N_D}W: Vbi=q2εNANDNA+NDW2  W=2εq(1NA+1ND)Vbi.V_{bi}=\frac{q}{2\varepsilon}\frac{N_AN_D}{N_A+N_D}W^2\ \Rightarrow\ W=\sqrt{\frac{2\varepsilon}{q}\Big(\tfrac1{N_A}+\tfrac1{N_D}\Big)V_{bi}}. (2)

(c) (5 marks) ε=11.7×8.854×1012=1.036×1010 F/m\varepsilon=11.7\times8.854\times10^{-12}=1.036\times10^{-10}\ \text{F/m}. Convert doping to m3^{-3}: NA=1023N_A=10^{23}, ND=1022N_D=10^{22}. 1NA+1ND=1023+1022=1.1×1022 m3\frac1{N_A}+\frac1{N_D}=10^{-23}+10^{-22}=1.1\times10^{-22}\ \text{m}^3. (1) W=2(1.036×1010)1.602×1019(1.1×1022)(0.774)W=\sqrt{\frac{2(1.036\times10^{-10})}{1.602\times10^{-19}}(1.1\times10^{-22})(0.774)} =21.036×1010/1.602×10190.7741.1×1022=\sqrt{2\cdot1.036\times10^{-10}/1.602\times10^{-19}\cdot0.774\cdot1.1\times10^{-22}}. Inner: 21.036×1010=2.072×10102\cdot1.036\times10^{-10}=2.072\times10^{-10}; /1.602×1019=1.293×109/1.602\times10^{-19}=1.293\times10^{9}; ×0.774=1.001×109\times0.774=1.001\times10^{9}; ×1.1×1022=1.101×1013\times1.1\times10^{-22}=1.101\times10^{-13}; W=1.101×1013=3.32×107 m=0.332 μmW=\sqrt{1.101\times10^{-13}}=3.32\times10^{-7}\ \text{m}=0.332\ \mu\text{m}. (2) Fraction in n-side =xn/W=NANA+ND=10171.1×1017=0.909=x_n/W=\frac{N_A}{N_A+N_D}=\frac{10^{17}}{1.1\times10^{17}}=0.909 (≈91 %). (1) Physical: to expose equal net charge each side (NAxp=NDxnN_Ax_p=N_Dx_n), the lightly-doped n-side (fewer dopants/vol) must deplete a wider region. (1)

(d) (5 marks) Emax=2Vbi/W=2×0.774/3.32×107=4.66×106 V/m=46.6 kV/cmE_{max}=2V_{bi}/W=2\times0.774/3.32\times10^{-7}=4.66\times10^{6}\ \text{V/m}=46.6\ \text{kV/cm}. (2) Sketch relationships (3):

  • ρ(x)\rho(x): step: qNA-qN_A (p-side), +qND+qN_D (n-side), narrower on p-side.
  • E(x)E(x): triangular, negative dip, peak magnitude at x=0x=0; E=1ερE=-\frac1\varepsilon\int\rho… i.e. dE/dx=ρ/εdE/dx=\rho/\varepsilon.
  • V(x)V(x): smooth S-curve rising by VbiV_{bi}; E=dV/dxE=-dV/dx, so V=EdxV=-\int E\,dx.

Question 2

(a) (5) VT=kBT/q=1.381×1023×300/1.602×1019=0.02585 VV_T=k_BT/q=1.381\times10^{-23}\times300/1.602\times10^{-19}=0.02585\ \text{V}. (2) For VVTV\gg V_T: IISeV/VTI\approx I_S e^{V/V_T}. Per decade: 10=eΔV/VT10=e^{\Delta V/V_T}ΔV=VTln10=0.02585×2.3026=0.0595 V60 mV\Delta V=V_T\ln10=0.02585\times2.3026=0.0595\ \text{V}\approx60\ \text{mV}. (3)

(b) (5) V=VTln(I/IS+1)VTln(103/1014)=0.02585×ln(1011)=0.02585×25.33=0.655 VV=V_T\ln(I/I_S+1)\approx V_T\ln(10^{-3}/10^{-14})=0.02585\times\ln(10^{11})=0.02585\times25.33=0.655\ \text{V}. (3) dI/dV=I/VTdI/dV=I/V_T (large forward), so rd=VT/I=0.02585/103=25.85 Ωr_d=V_T/I=0.02585/10^{-3}=25.85\ \Omega. (2)

(c) (7) Iteration: solve f(V)=IS(eV/VT1)Itarget=0f(V)=I_S(e^{V/V_T}-1)-I_{target}=0, f(V)=(IS/VT)eV/VTf'(V)=(I_S/V_T)e^{V/V_T}. Vk+1=VkIS(eVk/VT1)Itarget(IS/VT)eVk/VTV_{k+1}=V_k-\frac{I_S(e^{V_k/V_T}-1)-I_{target}}{(I_S/V_T)e^{V_k/V_T}}

import math
def solve_diode_V(Is, T, Itarget, tol=1e-12, itmax=100):
    kB = 1.381e-23; q = 1.602e-19
    VT = kB*T/q
    V = VT*math.log(Itarget/Is + 1.0)   # good initial guess (ideal-diode inverse)
    for _ in range(itmax):
        f  = Is*(math.exp(V/VT) - 1.0) - Itarget
        fp = (Is/VT)*math.exp(V/VT)
        step = f/fp
        V -= step
        if abs(step) < tol:             # stopping criterion
            break
    return V

Marks: correct f,ff,f' (2); iteration formula (2); sensible guess (1); stopping criterion (1); runnable structure (1).

(d) (5) IST3eEg/kBTI_S\propto T^3 e^{-E_g/k_BT}; the exponential dominates. dlnISdT=3T+EgkBT2\frac{d\ln I_S}{dT}=\frac{3}{T}+\frac{E_g}{k_BT^2}; for Si (Eg1.12E_g\approx1.12 eV) at 300 K the second term \gg first, giving ≈0.08/°C ⇒ e0.08×102.2e^{0.08\times10}\approx2.2, hence roughly doubling per 10 °C. (3) Consequence: at fixed forward VV, I=ISeV/VTI=I_S e^{V/V_T} rises with TT, risking thermal runaway (self-heating raises ISI_S, raises current, raises heating). (2)

Question 3

(a) (5) W(Vbi+VR)1/2W\propto(V_{bi}+V_R)^{1/2} (from Q1b with VbiVbi+VRV_{bi}\to V_{bi}+V_R). Cj=ε/W(Vbi+VR)1/2C_j=\varepsilon/W\propto(V_{bi}+V_R)^{-1/2}, so m=1/2m=1/2 for an abrupt junction. (3) Justification: reverse bias widens WW, separating the plates further, lowering capacitance; the \sqrt{} arises from the linear-field/Poisson integration. (Linearly-graded junctions give m=1/3m=1/3.) (2)

(b) (6)

  • Avalanche: carriers accelerated by high field gain enough energy to impact-ionise, multiplying carriers; occurs in lightly-doped, wide junctions (higher VBDV_{BD}, >~6 V). Positive temperature coefficient — hotter lattice → more phonon scattering → carriers reach ionisation energy over longer distance → higher VBDV_{BD}. (3)
  • Zener: direct field-induced band-to-band tunnelling across a very narrow depletion region; occurs in heavily-doped junctions (thin WW, low VBDV_{BD}, <~5 V). Negative temperature coefficient — higher TT narrows EgE_g, easing tunnelling → lower VBDV_{BD}. (3)

(c) (5) 5.6 V5.6\ \text{V} lies in the transition band but the positive temperature coefficient is decisive: it indicates avalanche (Zener has negative coefficient). Above ~6 V avalanche dominates; the positive sign confirms impact-ionisation is the mechanism here. (5)

[
  {"claim":"V_bi = 0.774 V for NA=1e17, ND=1e16, ni=1e10 at 300K",
   "code":"VT=1.381e-23*300/1.602e-19; Vbi=VT*log(1e17*1e16/(1e10)**2); result=abs(Vbi-0.774)<0.01"},
  {"claim":"Depletion width W approx 0.332 um",
   "code":"import sympy as sp; eps=11.7*8.854e-12; q=1.602e-19; VT=1.381e-23*300/q; Vbi=VT*sp.log(1e17*1e16/(1e10)**2); NA=1e23; ND=1e22; W=sp.sqrt(2*eps/q*(1/NA+1/ND)*Vbi); result=abs(float(W)-3.32e-7)<0.1e-7"},
  {"claim":"Fraction of W in n-side = 0.909",
   "code":"NA=1e17; ND=1e16; frac=NA/(NA+ND); result=abs(frac-0.909)<0.01"},
  {"claim":"Forward voltage for 1mA with Is=1e-14 is about 0.655 V",
   "code":"VT=1.381e-23*300/1.602e-19; V=VT*log(1e-3/1e-14+1); result=abs(V-0.655)<0.005"},
  {"claim":"Dynamic resistance rd = 25.85 ohm at 1mA",
   "code":"VT=1.381e-23*300/1.602e-19; rd=VT/1e-3; result=abs(rd-25.85)<0.5"},
  {"claim":"Voltage per decade approx 59.5 mV",
   "code":"VT=1.381e-23*300/1.602e-19; dV=VT*log(10); result=abs(dV-0.0595)<0.001"}
]